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Basic measurement of dynamic properties of bipolar and unipolar transistors
Lang, Radek ; Šotner, Roman (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. The other aim is to build a measuring workplace, on which is possible to carry out measurement of dynamic properties of bipolar and unipolar transistors. The bachelors’s thesis also solves a design and a production of an universal product, on which measurements are carried out. Individual measurement is automated and individual devices are connected to the product and results are controlled by computer analysis.
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Basic measurement of dynamic properties of bipolar and unipolar transistors
Lang, Radek ; Šotner, Roman (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. The other aim is to build a measuring workplace, on which is possible to carry out measurement of dynamic properties of bipolar and unipolar transistors. The bachelors’s thesis also solves a design and a production of an universal product, on which measurements are carried out. Individual measurement is automated and individual devices are connected to the product and results are controlled by computer analysis.
|
|
|
Basic measurement of dynamic properties of bipolar and unipolar transistors
Lang, Radek ; Šotner, Roman (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. The other aim is to build a measuring workplace, on which is possible to carry out measurement of dynamic properties of bipolar and unipolar transistors. The bachelors’s thesis also solves a design and a production of an universal product, on which measurements are carried out. Individual measurement is automated and individual devices are connected to the product and results are controlled by computer analysis.
|
|
|
Basic measurement of dynamic properties of bipolar and unipolar transistors
Lang, Radek ; Šotner, Roman (referee) ; Dřínovský, Jiří (advisor)
The aim of this bachelor’s thesis is to describe the dynamic parameters of semiconductor devices. The other aim is to build a measuring workplace, on which is possible to carry out measurement of dynamic properties of bipolar and unipolar transistors. The bachelors’s thesis also solves a design and a production of an universal product, on which measurements are carried out. Individual measurement is automated and individual devices are connected to the product and results are controlled by computer analysis.
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